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NAED Line Scan Camera QC — Wafer Defect

Name: NAED Line Scan Camera QC — Wafer Defect
SKU: NVP-EQ-CHAR-005

SKU NVP-EQ-CHAR-005

Price

$125,000.00

4096-px line-scan, AI classification, crack/chip/contamination. 2,500 wph.

Quantity

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