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NAED Film Thickness Monitor — Inline Ellipsometer

Name: NAED Film Thickness Monitor — Inline Ellipsometer
SKU: NVP-EQ-CVD-MEAS-001

SKU NVP-EQ-CVD-MEAS-001

Price

$145,000.00

Inline spectroscopic ellipsometer for real-time thin film thickness and optical constant measurement. Integrated into PECVD exit, measures SiNx, AlOx, a-Si:H. ±0.1 nm precision.

Quantity

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